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    STUDIA CHEMIA - Ediţia nr.3 din 2010  
         
  Articol:   X-RAY DIFFRACTION AND ATOMIC FORCE MICROSCOPY STUDIES OF CHEMICAL BATH DEPOSITED FeS THIN FILMS.

Autori:  ANUAR KASSIM, HO SOON MIN, ATAN SHARIF, SARAVANAN NAGALINGAM.
 
       
         
  Rezumat:  

FeS thin films were deposited onto indium tin oxide glass substrates by chemical bath deposition method. The main objective of the paper was to investigate the influence of the bath temperature on the properties of thin films. The structural and morphological properties of the thin films were studied using X-ray diffraction and atomic force microscopy, respectively. According to XRD results, the number of FeS peaks increased to four peaks and the intensities of these peaks were improved for the films deposited at higher bath temperature. The AFM analysis showed that an increased in bath temperature allowed more materials to be deposited onto the substrate and thicker films to be formed.

Keywords: chemical bath deposition, thin films, iron sulphide, X-ray diffraction

 
         
     
         
         
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