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    STUDIA PHYSICA - Issue no. 2 / 2010  
         
  Article:   AFM INVESTIGATION OF SIO2-ZNO-P2O5 THIN FILMS.

Authors:  R. VERES, M. TĂMĂŞAN. 		 
       
         
  Abstract:  SiO2-ZnO-P2O5 thin films were obtained by spin-coating of a sol-gel bioglass precursor. The Si:Zn:P ratio of 4:1:8 in the sol-gel precursor is related to a bioglass composition which has not been investigated before. Considering that the topography and morphology of the surfaces are of primary interest in the applications of biomaterials, structural and surface properties of the prepared films were investigated using the Atomic Force Microscopy (AFM), as well as thermal and X-ray Diffraction (XRD) analyses. XRD results showed that the film sample have a prevalent amorphous character. AFM analysis indicated a rough, inhomogeneous surface of the prepared films.

Keywords: biomaterials; sol-gel; thin film; AFM, XRD, TGA/DTA. 

 
         
     
         
         
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